← Papers

Paper record

Counting wheat heads using a simulation model

Sun X, Jiang T, Hu J, Song Z, Ge Y, Wang Y, Liu X, Bing J, Li J, Zhou Z, Tang Z, Zhao Y, Hao J, Zuo C, Geng X, Kong L.

Computers and Electronics in Agriculture. · 1 Jan 2025

Abstract

Numerous studies have reported a significant positive correlation between wheat yield and the quantity of wheat heads. However, collecting data on wheat heads in the field poses a challenge for several reasons, including the uncontrollable nature of the environment, inconsistent data quality, and ambiguous data truth. To address these challenges, we developed a simulation strategy to replicate the conditions of a real wheat field, which enabled the data collection process to be conducted indoors over a short period. After applying grayscale image processing to process the simulated wheat images, we trained and tested nine deep learning models: Faster-RCNN, YOLOv7, YOLOv8, CenterNet, SSD, RetinaNet, EfficientDet, Deformable-DETR and DINO. Our results indicated that YOLOv7 performed the best (R² = 0.963, RMSE = 2.463). We then compared our model trained on simulated wheat data to a model trained on real wheat data (R² = 0.963 vs 0.972, RMSE = 2.463 vs 2.692). We also achieved good model performance on five test sets: GWHD, SDAU2021-SDAU2024. The results demonstrated the efficacy of our simulation, which provides an efficient and convenient strategy for the precision agriculture community.

Code and data availability

公開状態または取得可能な本文経路を確認できませんでした。

No evidence-backed public reproduction asset is currently recorded.